On-line noise characterization

Dambrine, G. ; Danneville, F. ; Belquin, J.M. ; Cappy, A. (1994) On-line noise characterization. In: Gallium Arsenide Applications Symposium. GAAS 1994, 28-30 April 1994, Turin, Italy.
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Abstract

A new method for systematic measurements of noise parameters of field effect devices has been developed. This method can be easily implemented with a conventional on-wafer station. Since no tuner is needed, this technique does not require a long time of measurement and it is well suited for in line noise characterization.

Abstract
Document type
Conference or Workshop Item (Paper)
Creators
CreatorsAffiliationORCID
Dambrine, G.
Danneville, F.
Belquin, J.M.
Cappy, A.
Subjects
DOI
Deposit date
16 Feb 2006
Last modified
17 Feb 2016 14:42
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