A large-signal model for GaAs MESFET's and HEMT's valid at multiple DC bias-points

Cojocaru, Vicentiu I. ; Brazil, Thomas J. (1994) A large-signal model for GaAs MESFET's and HEMT's valid at multiple DC bias-points. In: Gallium Arsenide Applications Symposium. GAAS 1994, 28-30 April 1994, Turin, Italy.
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Abstract

In this paper we present a general-purpose GaAs FET nonlinear circuit model, for universal use (DC, small-signal and large-signal) which is valid at multiple DC operating points. Novel features of the model include: (i) a direct and reliable multi-bias point parameter extraction methodology (no optimisation required), based solely on CW S-parameter measurements, with an improved approach to the extraction of the parasitic resistances; (ii) more accurate models for the main non-linearities, with special attention paid to the gate capacitances, the intrinsic resistance and high-frequency dispersion in the drain circuit. The validity of the model is demonstrated through extensive power-sweep tests, carried out at different DC bias-points and different frequencies.

Abstract
Document type
Conference or Workshop Item (Paper)
Creators
CreatorsAffiliationORCID
Cojocaru, Vicentiu I.
Brazil, Thomas J.
Subjects
DOI
Deposit date
17 Feb 2006
Last modified
17 Feb 2016 14:44
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