Self-aligned proton implantation GaAs MESFET devices

Lanzieri, C. ; D'Eustacchio, P. ; Peroni, M. ; Cetronio, A. ; Ghione, G. ; Pirola, M. ; Carnera, A. ; Gasparotto, A. (1992) Self-aligned proton implantation GaAs MESFET devices. In: Gallium Arsenide Applications Symposium. GAAS 1992, 27-29 April 1992, Noordwijk, The Netherlands.
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Abstract

In this work we will demonstrate that Self Aligned Proton Implantation (SAPI) devices give excellent transconductance linearity (i.e. virtually constant at approximately 150 mS/mm for drain current in the range ldss to 15% Idss) and increased output resistance. Said devices, with a 0.5x300 um gate geometry, typically yield 1.6 dB noise figure and 9.0 dB associated gain at 12 GHz.

Abstract
Document type
Conference or Workshop Item (Paper)
Creators
CreatorsAffiliationORCID
Lanzieri, C.
D'Eustacchio, P.
Peroni, M.
Cetronio, A.
Ghione, G.
Pirola, M.
Carnera, A.
Gasparotto, A.
Subjects
DOI
Deposit date
17 Feb 2006
Last modified
17 Feb 2016 14:45
URI

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