Desrousseaux, P. ; Launay, P. ; Dubon-Chevallier, C. ; Dangla, J. ; Caquot, E.
(1990)
Compact ECL gate design for double mesa HBT process.
In: Gallium Arsenide Applications Symposium. GAAS 1990, 19-20 April 1990, Rome, Italy.
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Abstract
Emitter Coupled Logic (ECL) gate is a good candidate for gigabit logic when one uses GaAs/GaAlAs Heterojunction Bipolar Transistor (HBT). With the double mesa process, interconnections between the 5 transistors of the elemental gate have to climb the emitter and base mesas, leading to lack of density. A more compact design of the ECL gate has been achieved, in which the transistors are directly connected on the top of the base mesa. The DC characteristics of this gate are similar to these obtained with conventional gate design and the surface is reduced by a factor 1.6.
Abstract