Compact ECL gate design for double mesa HBT process

Desrousseaux, P. ; Launay, P. ; Dubon-Chevallier, C. ; Dangla, J. ; Caquot, E. (1990) Compact ECL gate design for double mesa HBT process. In: Gallium Arsenide Applications Symposium. GAAS 1990, 19-20 April 1990, Rome, Italy.
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Abstract

Emitter Coupled Logic (ECL) gate is a good candidate for gigabit logic when one uses GaAs/GaAlAs Heterojunction Bipolar Transistor (HBT). With the double mesa process, intercon­nections between the 5 transistors of the elemental gate have to climb the emitter and base mesas, leading to lack of density. A more compact design of the ECL gate has been achieved, in which the transistors are directly connected on the top of the base mesa. The DC characteristics of this gate are similar to these obtained with conventional gate design and the surface is reduced by a factor 1.6.

Abstract
Document type
Conference or Workshop Item (Paper)
Creators
CreatorsAffiliationORCID
Desrousseaux, P.
Launay, P.
Dubon-Chevallier, C.
Dangla, J.
Caquot, E.
Subjects
DOI
Deposit date
02 Feb 2006
Last modified
17 Feb 2016 14:49
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