Non invasive ultrafast optoelectronic sampling of GaAs devices

Breglio, Giovanni ; Cutolo, Antonello ; Zeni, Luigi (1990) Non invasive ultrafast optoelectronic sampling of GaAs devices. In: Gallium Arsenide Applications Symposium. GAAS 1990, 19-20 April 1990, Rome, Italy.
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Abstract

After describing the main characteristics of the electro-optical sampling technique for ultrafast integrated circuits and solid state devices, we discuss the performance of the ultra short pulse laser systems required for the use of this technique. In particular, we briefly describe a new technique for the real time analysis of the stability of this class of lasers.

Abstract
Tipologia del documento
Documento relativo ad un convegno o altro evento (Atto)
Autori
AutoreAffiliazioneORCID
Breglio, Giovanni
Cutolo, Antonello
Zeni, Luigi
Settori scientifico-disciplinari
DOI
Data di deposito
02 Feb 2006
Ultima modifica
17 Feb 2016 14:49
URI

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