Breglio, Giovanni ; Cutolo, Antonello ; Zeni, Luigi
(1990)
Non invasive ultrafast optoelectronic sampling of GaAs devices.
In: Gallium Arsenide Applications Symposium. GAAS 1990, 19-20 April 1990, Rome, Italy.
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Abstract
After describing the main characteristics of the electro-optical sampling technique for ultrafast integrated circuits and solid state devices, we discuss the performance of the ultra short pulse laser systems required for the use of this technique. In particular, we briefly describe a new technique for the real time analysis of the stability of this class of lasers.
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