FET Noise Model Extraction Methods

Stenarson, Jörgen ; Wadefalk, Niklas ; Garcia, Mikael ; Angelov, I. ; Zirath, Herbert (2000) FET Noise Model Extraction Methods. In: Gallium Arsenide applications symposium. GAAS 2000, 2-6 october 2000, Paris.
Full text disponibile come:
[thumbnail of GAAS1_2.pdf]
Anteprima
Documento PDF
Download (96kB) | Anteprima

Abstract

This paper presents an overview of the noise modeling extraction methods developed at the Microwave Electronics Laboratory at Chalmers University of Technology. The presented methods are suitable for different kinds of noise models, the one and two parameter Pospieszalski model, and the three parame-ter PRC model. We also present a low power low noise amplifier.

Abstract
Tipologia del documento
Documento relativo ad un convegno o altro evento (Atto)
Autori
AutoreAffiliazioneORCID
Stenarson, Jörgen
Wadefalk, Niklas
Garcia, Mikael
Angelov, I.
Zirath, Herbert
Settori scientifico-disciplinari
DOI
Data di deposito
17 Giu 2004
Ultima modifica
17 Feb 2016 13:41
URI

Altri metadati

Statistica sui download

Statistica sui download

Gestione del documento: Visualizza il documento

^