FET Noise Model Extraction Methods

Stenarson, Jörgen ; Wadefalk, Niklas ; Garcia, Mikael ; Angelov, I. ; Zirath, Herbert (2000) FET Noise Model Extraction Methods. In: Gallium Arsenide applications symposium. GAAS 2000, 2-6 october 2000, Paris.
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Abstract

This paper presents an overview of the noise modeling extraction methods developed at the Microwave Electronics Laboratory at Chalmers University of Technology. The presented methods are suitable for different kinds of noise models, the one and two parameter Pospieszalski model, and the three parame-ter PRC model. We also present a low power low noise amplifier.

Abstract
Document type
Conference or Workshop Item (Paper)
Creators
CreatorsAffiliationORCID
Stenarson, Jörgen
Wadefalk, Niklas
Garcia, Mikael
Angelov, I.
Zirath, Herbert
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DOI
Deposit date
17 Jun 2004
Last modified
17 Feb 2016 13:41
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