Low frequency dispersion effects on the input characteristics of microwave FETs

Cojocaru, Vicentiu I. ; Brazil, Thomas J. (2000) Low frequency dispersion effects on the input characteristics of microwave FETs. In: Gallium Arsenide applications symposium. GAAS 2000, 2-6 october 2000, Paris.
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Abstract

The paper presents the experimental results of a low frequency test carried on a packaged GaAs MESFET, emphasizing the presence of some significant dispersion effects in relation to the input C-V and I-V characteristics of the device. The test has been performed within the frequency range 10kHz÷40MHz on a commercial, packaged GaAs MESFET, connected in a special configuration and using an impedance meter system. The results presented show a significant variation of these two input characteristics with frequency.

Abstract
Document type
Conference or Workshop Item (Paper)
Creators
CreatorsAffiliationORCID
Cojocaru, Vicentiu I.
Brazil, Thomas J.
Subjects
DOI
Deposit date
17 Jun 2004
Last modified
17 Feb 2016 13:42
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