Flip-chip for space applications : Bonding reliability, DC and RF results.

George, Sebastien ; Drevon, C. ; Cazaux, Jean-Louis (2000) Flip-chip for space applications : Bonding reliability, DC and RF results. In: Gallium Arsenide applications symposium. GAAS 2000, 2-6 october 2000, Paris.
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Abstract

This paper presents a study of flip-chip bonding for space applications. DC and mechanical test vehicles have demonstrated the reliability of the flip-chip gold-gold thermocompression bonding up to 500 thermal cycles. RF test vehicles have proved the compatibility of both coplanar and microstrip on-the-shelves MMICs with the flip-chip bonding up to 35 GHz.

Abstract
Tipologia del documento
Documento relativo ad un convegno o altro evento (Atto)
Autori
AutoreAffiliazioneORCID
George, Sebastien
Drevon, C.
Cazaux, Jean-Louis
Settori scientifico-disciplinari
DOI
Data di deposito
17 Giu 2004
Ultima modifica
17 Feb 2016 13:44
URI

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