Measurement and Simulation of Microwave Noise Transient of InP/InGaAs DHBT with Polyimide Passivattion

Xiong, Yong Zhong ; Ng, Geok-Ing ; Wang, Hong ; Fu, Jeffrey S. ; K, Radhakrishnan (2001) Measurement and Simulation of Microwave Noise Transient of InP/InGaAs DHBT with Polyimide Passivattion. In: Gallium Arsenide applications symposium. GAAS 2001, 24-28 september 2001, London.
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Abstract

Measurement and simulation of microwave noise transient of InP/InGaAs DHBT with polyimide passivation is reported in this paper for the first time and is believed to contribute to the overall broadband shot noise. This work provides a better insight into the noise transient mechanism of InP HBTs due to polyimide passivation and can be used to improve the device and circuit reliability.

Abstract
Document type
Conference or Workshop Item (Paper)
Creators
CreatorsAffiliationORCID
Xiong, Yong Zhong
Ng, Geok-Ing
Wang, Hong
Fu, Jeffrey S.
K, Radhakrishnan
Subjects
DOI
Deposit date
17 Jun 2004
Last modified
17 Feb 2016 13:47
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