Reliability Overview of RF MEMS Devices and Circuits

Melle, S. ; Flourens, F. ; Dubuc, D. ; Grenier, K. ; Pons, P. ; Pressecq, F. ; Kuchenbecker, J. ; Muraro, J.L. ; Bary, L. ; Plana, R. (2003) Reliability Overview of RF MEMS Devices and Circuits. In: Gallium Arsenide applications symposium. GAAS 2003, 6-10 October 2003, Munich.
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Abstract
Document type
Conference or Workshop Item (Paper)
Creators
CreatorsAffiliationORCID
Melle, S.
Flourens, F.
Dubuc, D.
Grenier, K.
Pons, P.
Pressecq, F.
Kuchenbecker, J.
Muraro, J.L.
Bary, L.
Plana, R.
Subjects
DOI
Deposit date
17 Jun 2004
Last modified
17 Feb 2016 13:56
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