Melle, S. ; Flourens, F. ; Dubuc, D. ; Grenier, K. ; Pons, P. ; Pressecq, F. ; Kuchenbecker, J. ; Muraro, J.L. ; Bary, L. ; Plana, R.
(2003)
Reliability Overview of RF MEMS Devices and Circuits.
In: Gallium Arsenide applications symposium. GAAS 2003, 6-10 October 2003, Munich.
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