Determination of FET noise parameters from 50 Ω noise figure measurements using a distributed noise model

Maya, M.C. ; Lazaro, A. ; Pradell, L. (2002) Determination of FET noise parameters from 50 Ω noise figure measurements using a distributed noise model. In: Gallium Arsenide applications symposium. GAAS 2002, 23-27 september 2002, Milano.
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Abstract

A method for measuring FET noise parameters is presented. It is based on the determination of a distributed noise model from 50 Ω noise figure measurements without needing a tuner, and taking into account the propagation effects along device electrodes. Experimental results up to 40 GHz are given.

Abstract
Document type
Conference or Workshop Item (Paper)
Creators
CreatorsAffiliationORCID
Maya, M.C.
Lazaro, A.
Pradell, L.
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DOI
Deposit date
17 Jun 2004
Last modified
17 Feb 2016 13:35
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