Browse the list: Convegni ed altri Eventi

Up a level
Export as [Atom feed] Atom [RSS feed] RSS 1.0 [RSS2 feed] RSS 2.0
Number of documents:1.

Traverso, P.A. ; Pirazzini, M. ; Santarelli, A. ; Filicori, F. ; Raffo, A. (2005) Automated microwave device characterization set-up based on a technology-independent generalized Bias System. In: Proceedings of the 22nd IEEE Instrumentation and Measurement Technology Conference. IMTC 2005., 16-19 maggio 2005, Ottawa, Canada.

This list has been generated onTue Nov 12 20:37:10 2024 CET.
^