Direct observation of Gain compression mechanisms in PHEMT by RF Gate and Drain Currents

Meng, C. C. ; Peng, A. S. ; Wen, S. Y. ; Huang, G. W. (2002) Direct observation of Gain compression mechanisms in PHEMT by RF Gate and Drain Currents. In: Gallium Arsenide applications symposium. GAAS 2002, 23-27 september 2002, Milano.
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Abstract

Average rf gate and drain currents can be used to determine gain compression mechanisms for PHEMTs with different pinch-off voltages. Knee voltage, pinch-off voltage, breakdown voltage and Imax clip output I-V waveform of a PHEMT and cause gain compression. We found that there is a distinct signature in average rf gate and drain currents to characterize each gain compression mechanism in PHEMTs. A PHEMT with low pinch-off voltage behaves the same in rf gate and drain currents as a PHEMT with high pinch-off voltage in pinch-off voltage, knee voltage and breakdown voltage gain compression mechanisms, but behaves differently in Imax gain compression mechanisms.

Abstract
Document type
Conference or Workshop Item (Paper)
Creators
CreatorsAffiliationORCID
Meng, C. C.
Peng, A. S.
Wen, S. Y.
Huang, G. W.
Subjects
DOI
Deposit date
17 Jun 2004
Last modified
17 Feb 2016 13:35
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