Direct observation of Gain compression mechanisms in PHEMT by RF Gate and Drain Currents

Meng, C. C. ; Peng, A. S. ; Wen, S. Y. ; Huang, G. W. (2002) Direct observation of Gain compression mechanisms in PHEMT by RF Gate and Drain Currents. In: Gallium Arsenide applications symposium. GAAS 2002, 23-27 september 2002, Milano.
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Abstract

Average rf gate and drain currents can be used to determine gain compression mechanisms for PHEMTs with different pinch-off voltages. Knee voltage, pinch-off voltage, breakdown voltage and Imax clip output I-V waveform of a PHEMT and cause gain compression. We found that there is a distinct signature in average rf gate and drain currents to characterize each gain compression mechanism in PHEMTs. A PHEMT with low pinch-off voltage behaves the same in rf gate and drain currents as a PHEMT with high pinch-off voltage in pinch-off voltage, knee voltage and breakdown voltage gain compression mechanisms, but behaves differently in Imax gain compression mechanisms.

Abstract
Tipologia del documento
Documento relativo ad un convegno o altro evento (Atto)
Autori
AutoreAffiliazioneORCID
Meng, C. C.
Peng, A. S.
Wen, S. Y.
Huang, G. W.
Settori scientifico-disciplinari
DOI
Data di deposito
17 Giu 2004
Ultima modifica
17 Feb 2016 13:35
URI

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