Traverso, P.A. and Pirazzini, M. and Santarelli, A. and Filicori, F. and Raffo, A. (2005) Automated microwave device characterization set-up based on a technology-independent generalized Bias System. In: Proceedings of the 22nd IEEE Instrumentation and Measurement Technology Conference. IMTC 2005., 16-19 maggio 2005, Ottawa, Canada.