Giannini, F. ; Colantonio, P. ; Orengo, G. ; Serino, A.
(2004)
Distortion Characterization and Neural Network
Modeling for Microwave Devices.
In: Gallium Arsenide applications symposium. GAAS 2004, 11—12 Ottobre, Amsterdam.
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Abstract
A new method for characterization of HEMT
distortion parameters, which extracts the coefficents of
Taylor series expansion of Ids(Vgs,Vds), including all crossterms, from low-frequency harmonic measurements, has
been developed. The extracted parameters will be used
either in a Volterra series model around a fixed bias point
for third order characterization of small-signal Ids
nonlinearity, and in a large-signal model of Ids
characteristic, where its partial derivatives have been locally
characterized up to the third order in the whole bias region,
using a novel neural network representation. The two
models have been verified by harmonic measurements on a
AMS HEMT at 5 GHz.
Abstract
A new method for characterization of HEMT
distortion parameters, which extracts the coefficents of
Taylor series expansion of Ids(Vgs,Vds), including all crossterms, from low-frequency harmonic measurements, has
been developed. The extracted parameters will be used
either in a Volterra series model around a fixed bias point
for third order characterization of small-signal Ids
nonlinearity, and in a large-signal model of Ids
characteristic, where its partial derivatives have been locally
characterized up to the third order in the whole bias region,
using a novel neural network representation. The two
models have been verified by harmonic measurements on a
AMS HEMT at 5 GHz.
Document type
Conference or Workshop Item
(Paper)
Creators
Subjects
DOI
Deposit date
16 Jun 2005
Last modified
17 Feb 2016 14:13
URI
Other metadata
Document type
Conference or Workshop Item
(Paper)
Creators
Subjects
DOI
Deposit date
16 Jun 2005
Last modified
17 Feb 2016 14:13
URI
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