SiGe:C HBT technology for advanced BiCMOS processes.

Magnee, P. H. C. ; Hurkx, G. A. M. ; Agarwal, P. ; van Noort, W. D. ; Donkers, J. J. T. M. ; Melai, J. ; Aksen, E. ; Vanhoucke, T. ; Vijayaraghavan, M. N. (2004) SiGe:C HBT technology for advanced BiCMOS processes. In: Gallium Arsenide applications symposium. GAAS 2004, 11—12 Ottobre, Amsterdam.
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Abstract

In this paper we discuss the present status of SiGe:C heterojunction bipolar transistors (HBTs), together with some Figures-of-Merit (FOMs) and their relation to technology. We also discuss new innovative solutions to the relatively low breakdown voltage and high-frequency substrate losses of Si technologies, when compared to III-V based technologies.

Abstract
Document type
Conference or Workshop Item (Paper)
Creators
CreatorsAffiliationORCID
Magnee, P. H. C.
Hurkx, G. A. M.
Agarwal, P.
van Noort, W. D.
Donkers, J. J. T. M.
Melai, J.
Aksen, E.
Vanhoucke, T.
Vijayaraghavan, M. N.
Subjects
DOI
Deposit date
16 Jun 2005
Last modified
17 Feb 2016 14:15
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