Parameter extraction procedure for microwave and millimetre-wave monolithic FET-type devices based on a scalable distributed model

Castillo-Vázquez, B. ; Martin-Guerrero, T.M ; Camacho-Peñalosa, C. (1998) Parameter extraction procedure for microwave and millimetre-wave monolithic FET-type devices based on a scalable distributed model. In: Gallium Arsenide Applications Symposium. GAAS 1998, 5-6 October 1998, Amsterdam, The Netherlands.
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Abstract

A new parameter extraction procedure that uses a FET distributed model in conjunction with a standard optimization routine is presented. The model extraction is carried out by simultaneously fitting the S-parameters of various devices with different gate widths. This procedure has shown to be very robust and yields a very reliable identification of the model elements, both parasitic and intrinsic.

Abstract
Document type
Conference or Workshop Item (Paper)
Creators
CreatorsAffiliationORCID
Castillo-Vázquez, B.
Martin-Guerrero, T.M
Camacho-Peñalosa, C.
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DOI
Deposit date
16 Feb 2006
Last modified
17 Feb 2016 14:34
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