Chance-Constrained Automated Test Assembly

Spaccapanico Proietti, Giada ; Matteucci, Mariagiulia ; Mignani, Stefania ; Veldkamp, Bernard P. (2020) Chance-Constrained Automated Test Assembly. [Preprint]
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Abstract

Classical automated test assembly (ATA) methods assume fixed and known parameters, an hypothesis that is not true for estimates of item response theory parameters which are key elements in test assembly. To account for uncertainty in ATA, we propose a chance-constrained version of the MAXIMIN ATA model which allows to maximize the alpha-quantile of the sampling distribution function of the test information function obtained by bootstrapping the item parameters. An heuristic based on the simulated annealing is proposed to solve the ATA model. The validity of the proposed approach is verified by simulated data and the applicability is verified by an application to real data.

Abstract
Tipologia del documento
Preprint
Autori
AutoreAffiliazioneORCID
Spaccapanico Proietti, GiadaUniversity of Bologna0000-0002-9929-3354
Matteucci, MariagiuliaUniversity of Bologna0000-0003-3404-6325
Mignani, StefaniaUniversity of Bologna0000-0003-4746-1130
Veldkamp, Bernard P.University of Twente0000-0003-3543-2164
Parole chiave
"automated test assembly" "uncertainty" "chance-constrained" "simulated annealing"
Settori scientifico-disciplinari
DOI
Data di deposito
16 Giu 2020 08:21
Ultima modifica
16 Giu 2020 08:21
URI

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